CHTM upgrades to a new SEM - the JSM-IT100 InTouchScope from JEOL

March 3, 2016 - CHTM

JEOL JSM IT100 SEM sample screen

NOTICE: The old SEM
is now unavailable.

The arrival of the JEOL JSM-IT100 InTouchScope", scheduled for the week of March 21st, is highly anticipated! The IT100 is a simple-to-use, versatile, high-throughput, research-grade SEM (scanning electron microscope). 

The IT100 provides high resolution imaging and a range of acceleration voltages at both high and low vacuum modes. It has expanded EDS analysis capabilities and is described by JEOL as “remarkably intuitive,” with fast data acquisition and fast sample navigation at 5x – 300,000x magnifications. High quality images are obtained using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

To learn more about the IT100, visit the JEOL USA webpage for specifications.


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