Innovate New Mexico Technology Showcase
April 9, 2017
AFRL + CHTM NanoConference - A Day of Discussion
April 3, 2017
New spectroscopic Ellipsometer to be installed in CHTM cleanroom
April 1, 2016 - CHTM
A new spectroscopic J.A. Woollam Ellipsometer (model M-2000) will be installed in the CHTM cleanroom on April 4th and 5th. It will be operational and available to users on April 6th.
Tuesday, April 5, CHTM Room 101
2:00 pm: Lecture: "Introduction to Ellipsometry: Theory & Applications," by Dr. Tim Tiwald
2:45 pm: Break
3:00 pm: Hands-on J.A. Woollam software seminar. Bring your laptop! We will use actual data sets for practice.
6:00 pm: Session ends
Dr. Tom Tiwald, Applications Engineer with J.A. Woollam Co., will present the lecture and software seminar, open to everyone. (Bring your laptop for hands-on software practice!) Everyone is welcome to join and learn.
J.A. Woollam M-2000 spectroscopic Ellipsometer
Spectroscopic Ellipsometry (SE) is a non-contact, non-destructive optical technique that measures the change in polarization light upon reflection from a sample. SE can determine the optical properties (index and absorption) of bulk materials and films, as well as measure film thicknesses ranging from less than a single atomic layer to several micrometers.
Dr. Tiwald’s introductory lecture will cover basic ellipsometry theory, instrumentation, modeling and data analysis, and review examples of various applications. After the lecture, participants are invited to bring their own laptops to a working seminar so they can practice using the Woollam CompleteEASE® software for beginning data analysis (using real data examples).
Abstract: Dr. Tom Tiwald, Applications Engineer, J. A. Woollam Co., "Introduction to Ellipsometry: Theory and Applications."
The M-2000 Ellipsometer is engineered to meet the diverse demands of thin film characterization. It has high accuracy and precision and a wide spectral range with fast spectral detection (over 700 wavelengths from the ultraviolet to the near infrared are measured simultaneously). No other ellipsometer technology acquires a full spectrum faster.
Learn more about the J.A. Woollam M-2000 Ellipsometer on its product page.