Innovate New Mexico Technology Showcase
April 9, 2017
AFRL + CHTM NanoConference - A Day of Discussion
April 3, 2017
New Scanning Electron Microscope (SEM) being installed at CHTM this week
March 22, 2016 - CHTM
The JEOL JSM-IT100 InTouchScope™ is a simple-to-use, versatile, high-throughput, research-grade SEM (scanning electron microscope). It provides fast sample navigation at anywhere from 5x – 300,000x magnification. After it is set up by the JEOL engineer, demonstrations on its use will begin.
The new JEOL SEM is being installed in the same room off the laboratory chase that was occupied by the previous SEM.
After fifteen years of service, the trusty SEM is loaded onto the truck.
The new JEOL JSM IT100 as it is being set up at CHTM